Publications

The following list of publications is based on publications from Professor Rajan Ambat and Professor Jesper Hattel's researchers in the INSPE project. The list is automatically generated by the university database, and hence, it can also contains publications that are not related to the IN SPE project.

Publikationer

Sort:

ALL ARTICLE (56) DISSERTATION (5) BOOK (1) CONF (35) REPORT (0) MISC (0) PATENT (0) PEER REV (92)

2014

Corrosion in electronics: Overview of failures and countermeasures

Jellesen, Morten Stendahl ; Verdingovas, Vadimas ; Conseil, Helene ; Piotrowska, Kamila ; Ambat, Rajan
part of: Proceedings of EuroCorr 2014, 2014
Presented at: European Corrosion Congress

Type: Article in proceedings (Peer reviewed)

Status: Published | Year: 2014

Corrosion reliability of electronics: the influence of solder temperature on the decomposition of flux activators

Piotrowska, Kamila ; Conseil, Helene ; Jellesen, Morten Stendahl ; Ambat, Rajan
part of: Proceedings of EuroCorr 2014, 2014
Presented at: European Corrosion Congress

Type: Article in proceedings (Peer reviewed)

Status: Published | Year: 2014

Electrochemical migration in electronics: effect of contamination and bias conditions

Verdingovas, Vadimas ; Jellesen, Morten Stendahl ; Ambat, Rajan
Presented at: European Corrosion Congress

Type: Conference abstract for conference (Peer reviewed)

Status: Published | Year: 2014

Experimental study of water absorption of electronic components and internal local temperature and humidity into electronic enclosure

Conseil, Helene ; Jellesen, Morten Stendahl ; Ambat, Rajan
part of: Proceedings of the 16th Electronics Packaging Technology Conference (EPTC 2014) , pages: 355-359, 2015
Presented at: 16th Electronics Packaging Technology Conference

Type: Article in proceedings (Peer reviewed)

Status: Published | Year: 2014 | DOI: https://doi.org/10.1109/EPTC.2014.7028356

Impact of NaCl Contamination and Climatic Conditions on the Reliability of Printed Circuit Board Assemblies

Verdingovas, Vadimas ; Jellesen, Morten Stendahl ; Ambat, Rajan
in: I E E E Transactions on Device and Materials Reliability, vol: 14, issue: 1, pages: 42-51

Type: Journal article (Peer reviewed)

Status: Published | Year: 2014 | DOI: https://doi.org/10.1109/TDMR.2013.2293792

Perspectives on the climatic reliability issues of electronic devices

Ambat, Rajan ; Jellesen, Morten Stendahl ; Verdingovas, Vadimas ; Piotrowska, Kamila ; Conseil, Helene
part of: Proceedings of EuroCorr 2014, 2014
Presented at: European Corrosion Congress

Type: Article in proceedings (Peer reviewed)

Status: Published | Year: 2014

Power Cycling and Thermal Stresses Analysis for High Efficiency DC/DC Converter (IFBBC) in Repetitive Avalanche Conditions

Pittini, Riccardo ; Zhang, Zhe ; Staliulionis, Zygimantas ; Andersen, Michael A. E.
part of: Proceedings of 18th International Conference ELECTRONICS 2014 , pages: 33-38, 2014
Presented at: 18th International Conference ELECTRONICS 2014

Type: Article in proceedings (Peer reviewed)

Status: Published | Year: 2014 | DOI: https://doi.org/10.5755/e01.9786090210819

Thermal Modeling and Design of On-board DC-DC Power Converter using Finite Element Method

Staliulionis, Zygimantas ; Zhang, Zhe ; Pittini, Riccardo ; Andersen, Michael A. E. ; Noreika, A. ; Tarvydas, P.
in: Elektronika ir Elektrotechnika

Type: Journal article (Peer reviewed)

Status: Published | Year: 2014 | DOI: https://doi.org/10.5755/j01.eee

Thermal Modelling and Design of On-board DC-DC Power Converter using Finite Element Method

Staliulionis, Z. ; Zhang, Z. ; Pittini, R. ; Andersen, M. A. E. ; Noreika, A. ; Tarvydas, P.
in: Elektronika ir Elektrotechnika, vol: 20, issue: 7, pages: 38-44

Type: Journal article (Peer reviewed)

Status: Published | Year: 2014 | DOI: https://doi.org/10.5755/j01.eee.20.7.8022

2013

Analysis of mode-hopping effect in Fabry–Pérot multiple-quantum well laser diodes via low frequency noise investigation

Pralgauskaitė, Sandra ; Palenskis, Vilius ; Matukas, Jonas ; Šaulys, Bronius ; Kornijčuk, Vladimir ; Verdingovas, Vadimas
in: Solid-State Electronics, vol: 79, pages: 104-110

Type: Journal article (Peer reviewed)

Status: Published | Year: 2013 | DOI: https://doi.org/10.1016/j.sse.2012.07.021

Show all