Research

Electronic device reliability is influenced by a large number of parameters, many of which are interrelated. 

Exposure conditions, enclosure design, the electronic device itself and all of the involved materials can all play a vital role for device reliability. These parameters are studied in detail in the IN SPE project, and the knowledge obtained is being implemented into empirical and semi-empirical models that can aid the development of future generations of robust electronics.

Factors influencing electronic device reliability 

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Contact

Rajan Ambat
Professor
DTU Mechanical Engineering
+45 45 25 21 81